Spectrometru cu fluorescenta- nanotehnologii
The Nanolog® series of spectrofluorometers are specifically designed for research in nanotechnology and the frontiers of nanomaterials. A complete spectrum can be scanned as fast as a few milliseconds, and a full excitation emission matrix scan can be taken in just seconds.
Based on the world-wide proven technology of the FluoroLog®, the NanoLog® detects fluorescence in the near-IR from 800 to 1700 nm (optional multi-channel detection to 2 µm, single-channel detection to 3 µm), with visible and UV options possible. With the NanoLog® comes specially designed software called Nanosizer, ideal for classifying SWNTs, Quantum Dots and performing energy transfer calculations. Saving custom experimental routines and instrument layouts has never been easier.
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Features Rapid excitation-emission matrices in seconds High sensitivity in near-IR with InGaAs array High resolution Eases qualification and quantification of species and families of SWNTs Compatible with variety of detectors from UV to near-IR:Photomultiplier tube for highest sensitivity and timeresolved analysisPopular, cost-effective single-element InGaAsMulti-element CCD array for fast data-acquisition Resolve mixtures of quantum dots simultaneously Perform energy-transfer experiments Modular design for your ideal experimental setup.
Nanosizer® - for Single‐Walled Carbon Nanotube Excitation‐Emission Map Simulation and Analysis
Nanosizer® in Origin® Pro 8 simplifies the process for simulation and analysis for single‐walled carbon nanotube excitation‐emission map simulation and analysis. Nanosizer is used with our Nanolog spectrofluorometers, which are specifically designed for research in nanotechnology and nanomaterials. Nanosizer comes with our patented double-convolution-integral algorithm specially designed for determining chirality and diameter of single-walled carbon nanotubes.
Nanosizer® lets you simulate excitation-emission maps of SWNT near-IR fluorescence to compare to your actual data. Using built-in or custom libraries, Nanosizer® rapidly assigns specific peaks to particular SWNT (n,m) structures, and even generates helical maps. Nanosizer® also greatly simplifies FRET studies of SWNT bundles, length-distribution analyses, and nanotube purification analyses. Nanosizer®even offers a platform suitable to support future ISO and ASTM standards for identification and purification of semiconducting SWNTs.
Perfect for FRET in SWNT Bundles, Length Distribution Analysis, and Purification applications
Features and Benefits of Nanosizer® in OriginPro® 8
Efficient Region of Interest and Initial Model Parameterization
Virtually unlimited number of peaks
Global linking and fixing of peak parameters
Full constraints on all model peak parameters
Save Themes for rapid model parameterization
2D analytical line shapes: Gaussian, Lorentzian and Voigt Convolution
Correct statistical weighting of residuals
Fully featured statistical analysis of fit peak parameters
Graphical and tabular presentation of fit results and residuals
Fits data in energy (cm–1, eV) or wavelength (nm) units
Compares peak parameters to user editable library for helix angle, diameter and (n,m) distribution plots and tables
Designed for ISO and ASTM Standards for Semiconducting SWNT Identification/Quantification
450 W xenon short-arc. Collection and focusing by off-axis mirror for
maximum efficiency at all wavelengths.
Czerny-Turner with kinematic gratings and all-reflective optics. Optional double-grating units available for highest stray-light rejection and sensitivity. (Specifications based on 1200 grooves/mm grating, but other gratings are available)
0–1300 nm mechanical range; throughput based on grating’s blaze
500 nm blaze for excitation (300–1200 nm range); other gratings available
for different ranges.
Bandpass Set automatically
(0–30 nm single-grating, 0–15 nm double-grating) with auto-calibration on start-up.
T-box design to allow second emission-detection channel. Gap-bed removable for samplingaccessory replacement. Optional front-face detection.
TRIAX, for multi-channel acquisition, with triple-grating turret. Aspheric optical correction
practically eliminating astigmatism. (Specifications based on 150 grooves/mm gratings in a
double-grating monochromator. Other gratings are available.)
0–1500 nm mechanical range (using a 1200 grooves/mm grating);
throughput based on grating’s blaze
1200 grooves/mm, 500 nm blaze; 600 grooves/mm, 1000 nm blaze; 150 grooves/mm, 1200 nm blaze
Photodiode for excitation correction from 240–1000 nm. Standard emission detector is InGaAs
multi-channel array detector for rapid emission spectra. Optional IGA-020 InGaAs photodiode for
economical scanning from 800–1550 nm. Other PMTs to 1700 nm. Other detectors for higherwavelength emissions.
Windows™-based FluorEssence™ supplies all scanning, time-based, and accessory dataacquisition plus complete control of all hardware. Nanosizer™ for fitting of single-walled
carbon-nanotube spectra to known library to determine chiralities and diameters.
Steady-state gives a water-Raman peak S/N of 4000:1 at 397 nm, with 5 nm bandpass and background noise 1st standard deviation at 450 nm, on R928P photomultiplier tube. (When comparing
S/N, be sure that all settings and hardware are the same. For a full explanation on comparison of
S/N, please see our Application Note F-20, “How to Select the Best Spectrofluorometer”.)
Fluorescence Spectra from Carbon Nanotubes with the NanoLog
Photoluminescence of SWNTs
Better Signal-to-Noise Ratios for Carbon Nanotube Spectra
Near-IR Photoluminescence of Quantum Dots
Photoluminescence Spectroscopy of Quantum Dots
Better Data on Carbon Nanotubes with the NanoLog
Measuring Silica Nanoparticles via Fluorescence Anisotropy
The NanoLog Series: A New Generation of Performance
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